The SEMDEM program helps to examine the physical phenomena taking place inside semiconductor power devices during their operation, both in static and dynamic conditions. Distributions of various quantifies, such as electric potential, electron and hole density, current density, can be observed simultaneously in separate windows on the screen, together with the corresponding point on a static characteristic or a transient waveform. The possibility of modification of various parameters allows for interesting observations of influence of these parameters on static or dynamic characteristics of the analysed semiconductor devices.
Authors: Piotr Bugalski, Jacek Podgórski, Zbigniew Lisik, Marek Turowski